Three-dimensional near-field analysis through peak force scattering-type near-field optical microscopy
نویسندگان
چکیده
منابع مشابه
Three-dimensional mapping of optical near field with scattering SNOM.
Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher verti...
متن کاملScanning near-field optical microscopy.
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
متن کاملResolving near-field from high order signals of scattering near-field scanning optical microscopy.
The ability of using scattering-type near-field scanning optical microscopy (s-NSOM) to characterize amplitude and phase of optical near fields was investigated. We employ numerical simulations to compute signals scattered by the tip, using a bowtie nano-aperture as the example, and compare with the data obtained from s-NSOM measurements. Through demodulation of higher order harmonic signals, w...
متن کاملReal-Time Detection for Scattering Scanning Near-Field Optical Microscopy
Date The final copy of this thesis has been examined by the signatories, and we find that both the content and the form meet acceptable presentation standards of scholarly work in the above mentioned discipline. Thesis directed by Professor Markus Raschke Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for measuring spectroscopic properties of materials with s...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Nanoscale
سال: 2020
ISSN: 2040-3364,2040-3372
DOI: 10.1039/c9nr08417g